{"title":"RFIC自动处理设备测试的接地考虑","authors":"L. H. Koh, Y. H. Goh","doi":"10.23919/EOS/ESD.2018.8509786","DOIUrl":null,"url":null,"abstract":"This paper describes the grounding cables selection process in mitigating random degradation of more than 200 automated tester handlers’ parametric test yield in a back-end semiconductor factory, testing Radio Frequency Integrated Circuit ESD sensitive devices, due to stochastic high frequency ground current noise issues.","PeriodicalId":328499,"journal":{"name":"2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)","volume":"56 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Grounding Considerations for RFIC Automated Handling Equipment Testing\",\"authors\":\"L. H. Koh, Y. H. Goh\",\"doi\":\"10.23919/EOS/ESD.2018.8509786\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes the grounding cables selection process in mitigating random degradation of more than 200 automated tester handlers’ parametric test yield in a back-end semiconductor factory, testing Radio Frequency Integrated Circuit ESD sensitive devices, due to stochastic high frequency ground current noise issues.\",\"PeriodicalId\":328499,\"journal\":{\"name\":\"2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)\",\"volume\":\"56 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.23919/EOS/ESD.2018.8509786\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/EOS/ESD.2018.8509786","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Grounding Considerations for RFIC Automated Handling Equipment Testing
This paper describes the grounding cables selection process in mitigating random degradation of more than 200 automated tester handlers’ parametric test yield in a back-end semiconductor factory, testing Radio Frequency Integrated Circuit ESD sensitive devices, due to stochastic high frequency ground current noise issues.
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