影响贴片电阻和贴片电容焊点寿命的关键参数

N. Sangalli, D. Barker
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引用次数: 1

摘要

铝绝缘金属基板(IMS)经常被用作FR-4的替代品,以增强高功率应用中的散热。虽然IMS提供了更好的散热,但在热循环下,无引线芯片电阻和芯片电容器的焊点寿命会缩短。这是由于陶瓷基组件和铝板之间的热膨胀系数较高的不匹配。本文有两个主要目的。一是研究安装在IMS上的陶瓷片式电容和片式电阻的焊点寿命对介电厚度、电路板材料和焊料厚度变化的敏感性。该灵敏度分析采用有限元模拟方法进行。另一个目标是通过有限元建模和实验数据确定不同电阻尺寸在不同温度范围下的焊点寿命。这些结果以设计指南的形式呈现,用于选择元件尺寸,电路板材料和温度范围,给定预期的焊点寿命。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Key Parameters Affecting Solder Joint Life of Chip Resistors and Chip Capacitors Mounted on Insulated Metal Substrate
Aluminum insulated metal substrate (IMS) is often used as an alternative to FR-4 to enhance heat dissipation in high power applications. Although IMS offers better heat dissipation, the solder joint life of leadless chip resistors and chip capacitors under thermal cycling can decrease. This is due to the higher mismatch of the coefficient of thermal expansion between the ceramic based components and the aluminum board. This paper has two main objectives. One is to investigate the sensitivity of solder joint life of ceramic chip capacitor and chip resistor mounted on IMS to variations in dielectric thickness, board material, and solder thickness on. This sensitivity analysis is conducted with finite element analysis (FEA) simulation. The other objective is to determine the solder joint life for different resistor sizes at different temperature ranges with FEA modeling and experiment data. These results are presented in terms of design guidelines to be used in the selection of component size, board material, and temperature ranges, given an expected solder joint life.
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