{"title":"低电流和低电压——高端运放测试的挑战","authors":"Bob Cometta, J. Witte","doi":"10.1109/TEST.1997.639693","DOIUrl":null,"url":null,"abstract":"State-of-the-art op amps with input bias currents in the fA range and offset voltages of several /spl mu/V present special test problems. The authors discuss the measurement problems and their possible solutions. The topics discussed include: DSP based input bias current measurement; leakage current compensation; and current loop feedback.","PeriodicalId":186340,"journal":{"name":"Proceedings International Test Conference 1997","volume":"55 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Low current and low voltages-the high-end op amp testing challenge\",\"authors\":\"Bob Cometta, J. Witte\",\"doi\":\"10.1109/TEST.1997.639693\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"State-of-the-art op amps with input bias currents in the fA range and offset voltages of several /spl mu/V present special test problems. The authors discuss the measurement problems and their possible solutions. The topics discussed include: DSP based input bias current measurement; leakage current compensation; and current loop feedback.\",\"PeriodicalId\":186340,\"journal\":{\"name\":\"Proceedings International Test Conference 1997\",\"volume\":\"55 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1997-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings International Test Conference 1997\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.1997.639693\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings International Test Conference 1997","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1997.639693","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Low current and low voltages-the high-end op amp testing challenge
State-of-the-art op amps with input bias currents in the fA range and offset voltages of several /spl mu/V present special test problems. The authors discuss the measurement problems and their possible solutions. The topics discussed include: DSP based input bias current measurement; leakage current compensation; and current loop feedback.
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