硬化单端电流型PWM控制器的总剂量和单事件测试

2010 IEEE Radiation Effects Data Workshop Pub Date : 2010-07-20 DOI:10.1109/REDW.2010.5619502

N. V. van Vonno, L. Pearce, G. M. Wood, J. D. White, E. Thomson, T. Bernard, P. J. Chesley, R. Hood

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引用次数: 19

摘要

我们报告了ISL7884xASRH硬化单端电流模式PWM控制器的总剂量和SEE测试结果，包括部分设计，工艺和辐射测试结果的讨论。该部件在亚微米BiCMOS中实现。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Total Dose and Single Event Testing of a Hardened Single-Ended Current Mode PWM Controller

We report results of total dose and SEE testing of the ISL7884xASRH hardened single-ended current mode PWM controller including discussion of part design, process and radiation testing results. The part is implemented in submicron BiCMOS.

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来源期刊

2010 IEEE Radiation Effects Data Workshop

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