内置故障诊断的分层测试生成

Proceedings of the Fifth Asian Test Symposium (ATS'96) Pub Date : 1996-11-20 DOI:10.1109/ATS.1996.555130

D. Stroobandt, J. V. Campenhout

{"title":"内置故障诊断的分层测试生成","authors":"D. Stroobandt, J. V. Campenhout","doi":"10.1109/ATS.1996.555130","DOIUrl":null,"url":null,"abstract":"A hierarchical test generation method is presented that uses the inherent hierarchical structure of the circuit under test and takes fault diagnosability into account right from the start. An efficient test compaction method leads to a very compact test set, while retaining a maximum of diagnostic power and a 100% fault coverage for non-fanout circuits. An extension for fanout circuits is also presented.","PeriodicalId":215252,"journal":{"name":"Proceedings of the Fifth Asian Test Symposium (ATS'96)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Hierarchical test generation with built-in fault diagnosis\",\"authors\":\"D. Stroobandt, J. V. Campenhout\",\"doi\":\"10.1109/ATS.1996.555130\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A hierarchical test generation method is presented that uses the inherent hierarchical structure of the circuit under test and takes fault diagnosability into account right from the start. An efficient test compaction method leads to a very compact test set, while retaining a maximum of diagnostic power and a 100% fault coverage for non-fanout circuits. An extension for fanout circuits is also presented.\",\"PeriodicalId\":215252,\"journal\":{\"name\":\"Proceedings of the Fifth Asian Test Symposium (ATS'96)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1996-11-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the Fifth Asian Test Symposium (ATS'96)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATS.1996.555130\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the Fifth Asian Test Symposium (ATS'96)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.1996.555130","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 4

摘要

提出了一种利用被测电路固有的层次结构，从一开始就考虑故障可诊断性的分层测试生成方法。一个有效的测试压缩方法导致一个非常紧凑的测试集，同时保留最大的诊断能力和100%的非扇出电路故障覆盖率。对扇出电路进行了扩展。

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Hierarchical test generation with built-in fault diagnosis

A hierarchical test generation method is presented that uses the inherent hierarchical structure of the circuit under test and takes fault diagnosability into account right from the start. An efficient test compaction method leads to a very compact test set, while retaining a maximum of diagnostic power and a 100% fault coverage for non-fanout circuits. An extension for fanout circuits is also presented.

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Proceedings of the Fifth Asian Test Symposium (ATS'96)

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