{"title":"金衬垫上分离材料的三维原子发射光谱","authors":"T. Uchida, A. Tanaka, K. Tsutsumi, N. Ikeo","doi":"10.1109/IPFA.2016.7564292","DOIUrl":null,"url":null,"abstract":"Auger electron spectroscopy (AES) has been developed as a useful technique for chemical analysis of surface regions with high spatial and depth resolution. In this report, we present a newly developed system of AES which visualizes high-resolution distributions of the segregated materials on an Au pad by the 3-dimensional mapping.","PeriodicalId":206237,"journal":{"name":"2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)","volume":"38 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-07-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Three-dimensional AES of segregated materials on a gold pad\",\"authors\":\"T. Uchida, A. Tanaka, K. Tsutsumi, N. Ikeo\",\"doi\":\"10.1109/IPFA.2016.7564292\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Auger electron spectroscopy (AES) has been developed as a useful technique for chemical analysis of surface regions with high spatial and depth resolution. In this report, we present a newly developed system of AES which visualizes high-resolution distributions of the segregated materials on an Au pad by the 3-dimensional mapping.\",\"PeriodicalId\":206237,\"journal\":{\"name\":\"2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)\",\"volume\":\"38 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-07-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IPFA.2016.7564292\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IPFA.2016.7564292","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Three-dimensional AES of segregated materials on a gold pad
Auger electron spectroscopy (AES) has been developed as a useful technique for chemical analysis of surface regions with high spatial and depth resolution. In this report, we present a newly developed system of AES which visualizes high-resolution distributions of the segregated materials on an Au pad by the 3-dimensional mapping.