嵌入式双轨检测仪，具有在线检测功能

Proceedings of 14th VLSI Test Symposium Pub Date : 1996-04-28 DOI:10.1109/VTEST.1996.510849

C. Metra, M. Favalli, B. Riccò

{"title":"嵌入式双轨检测仪，具有在线检测功能","authors":"C. Metra, M. Favalli, B. Riccò","doi":"10.1109/VTEST.1996.510849","DOIUrl":null,"url":null,"abstract":"This paper addresses the problem of the design of embedded two-rail checkers. In particular a simple additional circuit is proposed which can be used to make a two-rail checker receive all the codewords of the two-rail code, independently of which and how many codewords are produced by its driving functional block or checkers. The proposed circuit features a high online self-testing ability with respect to possible internal faults and a compact structure.","PeriodicalId":424579,"journal":{"name":"Proceedings of 14th VLSI Test Symposium","volume":"6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-04-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"18","resultStr":"{\"title\":\"Embedded two-rail checkers with on-line testing ability\",\"authors\":\"C. Metra, M. Favalli, B. Riccò\",\"doi\":\"10.1109/VTEST.1996.510849\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper addresses the problem of the design of embedded two-rail checkers. In particular a simple additional circuit is proposed which can be used to make a two-rail checker receive all the codewords of the two-rail code, independently of which and how many codewords are produced by its driving functional block or checkers. The proposed circuit features a high online self-testing ability with respect to possible internal faults and a compact structure.\",\"PeriodicalId\":424579,\"journal\":{\"name\":\"Proceedings of 14th VLSI Test Symposium\",\"volume\":\"6 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1996-04-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"18\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of 14th VLSI Test Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VTEST.1996.510849\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 14th VLSI Test Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTEST.1996.510849","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 18

摘要

本文研究了嵌入式双轨校验器的设计问题。特别地，提出了一种简单的附加电路，该电路可用于使双轨校验器接收双轨码的所有码字，而与其驱动功能块或校验器产生的码字无关。该电路对可能的内部故障具有高度的在线自检能力和紧凑的结构。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Embedded two-rail checkers with on-line testing ability

This paper addresses the problem of the design of embedded two-rail checkers. In particular a simple additional circuit is proposed which can be used to make a two-rail checker receive all the codewords of the two-rail code, independently of which and how many codewords are produced by its driving functional block or checkers. The proposed circuit features a high online self-testing ability with respect to possible internal faults and a compact structure.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

Proceedings of 14th VLSI Test Symposium

自引率

0.00%

发文量