{"title":"ECC-on-SIMM测试挑战","authors":"T. J. Dell","doi":"10.1109/TEST.1994.527993","DOIUrl":null,"url":null,"abstract":"The typical personal computer of today is used more and more to perform functions and run application programs that are critical to a business's success. One of the biggest problems that inhibits productivity in this environment Is the effect of a lock-up, crash or parity error caused by cosmic-ray radiation-induced soft errors in the DRAM chips. IBM has announced a family of plug-compatible, retrofittable SIMMs with built-in ECC to provide a solution to this problem. This paper addresses the challenges associated with the full functional test of a SIMM with on-board ECC using a very test-unfriendly industry-standard memory module interface.","PeriodicalId":309921,"journal":{"name":"Proceedings., International Test Conference","volume":"23 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"ECC-on-SIMM test challenges\",\"authors\":\"T. J. Dell\",\"doi\":\"10.1109/TEST.1994.527993\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The typical personal computer of today is used more and more to perform functions and run application programs that are critical to a business's success. One of the biggest problems that inhibits productivity in this environment Is the effect of a lock-up, crash or parity error caused by cosmic-ray radiation-induced soft errors in the DRAM chips. IBM has announced a family of plug-compatible, retrofittable SIMMs with built-in ECC to provide a solution to this problem. This paper addresses the challenges associated with the full functional test of a SIMM with on-board ECC using a very test-unfriendly industry-standard memory module interface.\",\"PeriodicalId\":309921,\"journal\":{\"name\":\"Proceedings., International Test Conference\",\"volume\":\"23 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-10-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings., International Test Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.1994.527993\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings., International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1994.527993","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The typical personal computer of today is used more and more to perform functions and run application programs that are critical to a business's success. One of the biggest problems that inhibits productivity in this environment Is the effect of a lock-up, crash or parity error caused by cosmic-ray radiation-induced soft errors in the DRAM chips. IBM has announced a family of plug-compatible, retrofittable SIMMs with built-in ECC to provide a solution to this problem. This paper addresses the challenges associated with the full functional test of a SIMM with on-board ECC using a very test-unfriendly industry-standard memory module interface.
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