{"title":"具有电测量的MEMS陀螺仪中电气和机械耦合的表征","authors":"Margot Morlans, J. Guerard, J. Juillard","doi":"10.1109/dtip54218.2021.9568500","DOIUrl":null,"url":null,"abstract":"We propose an intuitive way to characterize the parasitic couplings in a weakly-coupled resonator. Here the study is focused on MEMS gyroscopes, one example of coupled resonator. Knowing the value of electrical and mechanical coupling will then allow us to electronically cancel them, and thus to reduce the bias instability of the gyroscope measures.","PeriodicalId":173313,"journal":{"name":"2021 Symposium on Design, Test, Integration & Packaging of MEMS and MOEMS (DTIP)","volume":"43 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-08-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Characterization of electrical and mechanical coupling in MEMS gyroscopes with electrical measurements\",\"authors\":\"Margot Morlans, J. Guerard, J. Juillard\",\"doi\":\"10.1109/dtip54218.2021.9568500\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We propose an intuitive way to characterize the parasitic couplings in a weakly-coupled resonator. Here the study is focused on MEMS gyroscopes, one example of coupled resonator. Knowing the value of electrical and mechanical coupling will then allow us to electronically cancel them, and thus to reduce the bias instability of the gyroscope measures.\",\"PeriodicalId\":173313,\"journal\":{\"name\":\"2021 Symposium on Design, Test, Integration & Packaging of MEMS and MOEMS (DTIP)\",\"volume\":\"43 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-08-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 Symposium on Design, Test, Integration & Packaging of MEMS and MOEMS (DTIP)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/dtip54218.2021.9568500\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 Symposium on Design, Test, Integration & Packaging of MEMS and MOEMS (DTIP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/dtip54218.2021.9568500","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Characterization of electrical and mechanical coupling in MEMS gyroscopes with electrical measurements
We propose an intuitive way to characterize the parasitic couplings in a weakly-coupled resonator. Here the study is focused on MEMS gyroscopes, one example of coupled resonator. Knowing the value of electrical and mechanical coupling will then allow us to electronically cancel them, and thus to reduce the bias instability of the gyroscope measures.