工艺参数对汽车环境下各种封装高温老化性能的影响

B. M. Auguste, L. Pascal, G. Annabelle, F. Hélène
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引用次数: 6

摘要

与Kirkendall空洞有关的破坏机制是金属间厚度增长(Au- Al)的结果。它影响了高温下导线的粘接可靠性。温度加速了金与铝之间的扩散,加速了金属间厚度的增长。通过简单解析模型和有限元模拟验证了实验结果。该研究证实了高热老化(150℃)汽车环境的良好选择。最后,热行为的WP和BS测试不允许连续监测降解,并且是时间和样品消耗。因此,我们正在开发一种测量程序,结合对线键电阻变化的理论研究,旨在产生球键的早期失效指标。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Influence of Technological Parameters on the Behavior during Aging at High Temperature of Various Packages, in the Automotive Environment
The failure mechanism related to Kirkendall voids is a consequence of the intermetallic thickness growth (Au- Al). It impacts the wires bonding reliability at high temperature. Temperature accelerates the intermetallic thickness growth as the diffusion between gold and aluminium is accelerated. Moreover, the role of the package geometry was identified, and experimental results were confirmed by both simple analytical model and FEM simulations. This study confirms a good choice for the automotive environment at high thermal aging (150degC). Finally, the WP and BS tests of the thermal behavior do not allow a continuous monitoring of the degradation, and are time and sample consuming. So we are developing a measurement procedure coupled to a theoretical study of the resistance variation of the wire bond, aimed to produce an early failure indicator of the ball bonds.
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