HBM应力前后的电压及其对动态触发电源钳的影响

2004 Electrical Overstress/Electrostatic Discharge Symposium Pub Date : 2004-09-01 DOI:10.1109/EOSESD.2004.5272616

R. Ashton, B. Weir, G. Weiss, T. Meuse

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引用次数: 25

摘要

动态触发CMOS电源钳的HBM和TLP测量结果发现，对于低泄漏钳，HBM和TLP测量结果不一致。发现在低HBM电压下的故障是由于导致HBM脉冲的电压斜坡导致钳位无法打开。

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Voltages before and after HBM stress and their effect on dynamically triggered power supply clamps

HBM and TLP measurements on dynamically triggered CMOS power supply clamps were found to be inconsistent for low leakage clamps. The failures at low HBM voltage were found to be due to a voltage ramp leading up to the HBM pulse which prevented the clamps from turning on.

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2004 Electrical Overstress/Electrostatic Discharge Symposium

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