触发器选择最大化TDF覆盖与部分增强扫描

16th Asian Test Symposium (ATS 2007) Pub Date : 2007-10-08 DOI:10.1109/ATS.2007.96

Gefu Xu, A. Singh

{"title":"触发器选择最大化TDF覆盖与部分增强扫描","authors":"Gefu Xu, A. Singh","doi":"10.1109/ATS.2007.96","DOIUrl":null,"url":null,"abstract":"Enhanced scan designs support high coverage TDF testing but with significant overhead. We present a flip-flop selection strategy for partial enhanced scan designs that offers a favorable trade-off between coverage and overhead. Experimental results using commercial ATPG tools show that 60-90% of the TDF coverage benefits of enhanced scan can be achieved at 10-30% of the cost.","PeriodicalId":289969,"journal":{"name":"16th Asian Test Symposium (ATS 2007)","volume":"31 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-10-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"19","resultStr":"{\"title\":\"Flip-flop Selection to Maximize TDF Coverage with Partial Enhanced Scan\",\"authors\":\"Gefu Xu, A. Singh\",\"doi\":\"10.1109/ATS.2007.96\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Enhanced scan designs support high coverage TDF testing but with significant overhead. We present a flip-flop selection strategy for partial enhanced scan designs that offers a favorable trade-off between coverage and overhead. Experimental results using commercial ATPG tools show that 60-90% of the TDF coverage benefits of enhanced scan can be achieved at 10-30% of the cost.\",\"PeriodicalId\":289969,\"journal\":{\"name\":\"16th Asian Test Symposium (ATS 2007)\",\"volume\":\"31 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-10-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"19\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"16th Asian Test Symposium (ATS 2007)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATS.2007.96\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"16th Asian Test Symposium (ATS 2007)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.2007.96","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 19

摘要

增强的扫描设计支持高覆盖率的TDF测试，但开销很大。我们提出了一种局部增强扫描设计的触发器选择策略，在覆盖和开销之间提供了有利的权衡。使用商用ATPG工具的实验结果表明，增强扫描的60-90%的TDF覆盖优势可以在10-30%的成本下实现。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Flip-flop Selection to Maximize TDF Coverage with Partial Enhanced Scan

Enhanced scan designs support high coverage TDF testing but with significant overhead. We present a flip-flop selection strategy for partial enhanced scan designs that offers a favorable trade-off between coverage and overhead. Experimental results using commercial ATPG tools show that 60-90% of the TDF coverage benefits of enhanced scan can be achieved at 10-30% of the cost.

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来源期刊

16th Asian Test Symposium (ATS 2007)

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