高温高压下环氧树脂封装空间电荷分布的测量

Kosuke Sato, S. Konishi, H. Miyake, Y. Tanaka
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引用次数: 3

摘要

研究了环氧树脂在高温高压下的空间电荷积累特性。近年来,随着半导体工作温度的不断提高,要求开发一种新型的半导体封装绝缘材料,使其在高电应力和高温下也能保持较高的绝缘性能。空间电荷积累特性是评价材料绝缘性能的重要因素之一。因此,本研究采用PEA(脉冲电声)方法,对半导体封装材料环氧树脂在高温、高电场作用下的空间电荷行为进行了研究。虽然有很多需求知道环氧树脂在相对较高的温度下的绝缘性能,如超过100°C,但普通的PEA系统适用于从室温到80°C左右的温度测量。因此,我们改进了PEA系统,可以在100°C下进行测量。在本报告中,使用了两种环氧板样品:一种是用胺型固化剂(EP-A)制成的,另一种是用酸酐固化剂(EP-NH)制成的。结果发现,即使在100℃下大于100 kV/mm的直流应力下,EP-A中也观察到明显的空间电荷积累,而EP-NH中则未观察到空间电荷积累。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Measurement of Space Charge Distribution in Epoxy Resin Package at High Temperature under High DC Stress
Space charge accumulation properties were investigated on epoxy resin under high dc stresses at high temperature. Due to the recent improvement in operable temperature of semiconductors, it is required to develop a new insulating material for semiconductor packaging, which exhibit a high insulation performance even at high temperature under the high electric stress. To estimate the insulation performance, it is said that the space charge accumulation is characteristic one of important factors for the evaluation of the materials. Therefore, in this study, the space charge behavior in epoxy resin, that is widely used as a semiconductor packaging material, is evaluated using PEA (Pulsed Electro Acoustic) method at high temperature under high electric field. While there are many demand to know the insulating properties in epoxy resin at relatively high temperature like more than 100 °C the ordinary PEA system was applicable to the measurement at temperature from room temperature to about 80 °C. Therefore, we improved the PEA system available to the measurement at 100 °C. In this report, two types of epoxy plate samples were used: one is made using an amine type curing agent (EP-A) and another is made using acid anhydride curing agent (EP-NH). As a result, it was found that an obvious amount of space charge accumulation was observed in EP-A, while it was not observed in EP-NH even under the dc stress of more than 100 kV/mm at 100 °C.
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