{"title":"用于混合信号电路的BIST模块","authors":"S. Demidenko, V. Piuri, V. Yarmolik, A. Shmidman","doi":"10.1109/DFTVS.1998.732185","DOIUrl":null,"url":null,"abstract":"T-flip-flop implementation of the universal module (signature analyzer and test generator) for built-in self-test of mixed signal circuits is proposed and analyzed.","PeriodicalId":245879,"journal":{"name":"Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223)","volume":"59 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-11-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"BIST module for mixed-signal circuits\",\"authors\":\"S. Demidenko, V. Piuri, V. Yarmolik, A. Shmidman\",\"doi\":\"10.1109/DFTVS.1998.732185\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"T-flip-flop implementation of the universal module (signature analyzer and test generator) for built-in self-test of mixed signal circuits is proposed and analyzed.\",\"PeriodicalId\":245879,\"journal\":{\"name\":\"Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223)\",\"volume\":\"59 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1998-11-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DFTVS.1998.732185\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFTVS.1998.732185","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
T-flip-flop implementation of the universal module (signature analyzer and test generator) for built-in self-test of mixed signal circuits is proposed and analyzed.
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