M. Lozano, C. Cané, J. Santander, I. Gràcia, E. Lora-Tamayo
{"title":"一种可移动屏蔽盒,适用于商用自动晶圆探测器","authors":"M. Lozano, C. Cané, J. Santander, I. Gràcia, E. Lora-Tamayo","doi":"10.1109/ICMTS.1993.292917","DOIUrl":null,"url":null,"abstract":"A compact movable shielding box designed to be easily adapted to commercial automatic wafer probers is presented. This design allows the realization of automatic wafer mapping in a shielded area. It only covers the chuck and the prober area, avoiding the use of cumbersome Faraday boxes. Its design is explained, and the effective shielding capabilities are demonstrated by measuring subthreshold currents.<<ETX>>","PeriodicalId":123048,"journal":{"name":"ICMTS 93 Proceedings of the 1993 International Conference on Microelectronic Test Structures","volume":"128 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-03-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A moveable shielding box adaptable to commercial automatic wafer probers\",\"authors\":\"M. Lozano, C. Cané, J. Santander, I. Gràcia, E. Lora-Tamayo\",\"doi\":\"10.1109/ICMTS.1993.292917\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A compact movable shielding box designed to be easily adapted to commercial automatic wafer probers is presented. This design allows the realization of automatic wafer mapping in a shielded area. It only covers the chuck and the prober area, avoiding the use of cumbersome Faraday boxes. Its design is explained, and the effective shielding capabilities are demonstrated by measuring subthreshold currents.<<ETX>>\",\"PeriodicalId\":123048,\"journal\":{\"name\":\"ICMTS 93 Proceedings of the 1993 International Conference on Microelectronic Test Structures\",\"volume\":\"128 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1993-03-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ICMTS 93 Proceedings of the 1993 International Conference on Microelectronic Test Structures\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICMTS.1993.292917\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ICMTS 93 Proceedings of the 1993 International Conference on Microelectronic Test Structures","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICMTS.1993.292917","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A moveable shielding box adaptable to commercial automatic wafer probers
A compact movable shielding box designed to be easily adapted to commercial automatic wafer probers is presented. This design allows the realization of automatic wafer mapping in a shielded area. It only covers the chuck and the prober area, avoiding the use of cumbersome Faraday boxes. Its design is explained, and the effective shielding capabilities are demonstrated by measuring subthreshold currents.<>