{"title":"氧传感器用TiO/ sub2 /阳极氧化膜","authors":"C. Podaru, V. Avramescu, R. Enache, G. Stoica","doi":"10.1109/SMICND.1998.733813","DOIUrl":null,"url":null,"abstract":"This paper presents a method used to produce TiO/sub 2/ sensitive layers based on the selective anodization of the titanium thin film realised by vacuum evaporation. Photoresist was used as mask for anodization. The thickness of the TiO/sub 2/ layers obtained in this experiment was between 1000-1200 /spl Aring/. IR and X-ray investigation were performed in order to characterize the structure of the layer. Sensitivity to O/sub 2/ was measured using a dedicated micromachine silicon structure. A quasilinear dependence of the resistivity of the TiO/sub 2/ layer versus the O/sub 2/ concentration was observed in the range of 100-10000 ppm.","PeriodicalId":406922,"journal":{"name":"1998 International Semiconductor Conference. CAS'98 Proceedings (Cat. No.98TH8351)","volume":"52 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"TiO/sub 2/ anodic oxide films for oxygen gas sensors\",\"authors\":\"C. Podaru, V. Avramescu, R. Enache, G. Stoica\",\"doi\":\"10.1109/SMICND.1998.733813\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a method used to produce TiO/sub 2/ sensitive layers based on the selective anodization of the titanium thin film realised by vacuum evaporation. Photoresist was used as mask for anodization. The thickness of the TiO/sub 2/ layers obtained in this experiment was between 1000-1200 /spl Aring/. IR and X-ray investigation were performed in order to characterize the structure of the layer. Sensitivity to O/sub 2/ was measured using a dedicated micromachine silicon structure. A quasilinear dependence of the resistivity of the TiO/sub 2/ layer versus the O/sub 2/ concentration was observed in the range of 100-10000 ppm.\",\"PeriodicalId\":406922,\"journal\":{\"name\":\"1998 International Semiconductor Conference. CAS'98 Proceedings (Cat. No.98TH8351)\",\"volume\":\"52 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1998-10-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1998 International Semiconductor Conference. CAS'98 Proceedings (Cat. No.98TH8351)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SMICND.1998.733813\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1998 International Semiconductor Conference. CAS'98 Proceedings (Cat. No.98TH8351)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SMICND.1998.733813","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
TiO/sub 2/ anodic oxide films for oxygen gas sensors
This paper presents a method used to produce TiO/sub 2/ sensitive layers based on the selective anodization of the titanium thin film realised by vacuum evaporation. Photoresist was used as mask for anodization. The thickness of the TiO/sub 2/ layers obtained in this experiment was between 1000-1200 /spl Aring/. IR and X-ray investigation were performed in order to characterize the structure of the layer. Sensitivity to O/sub 2/ was measured using a dedicated micromachine silicon structure. A quasilinear dependence of the resistivity of the TiO/sub 2/ layer versus the O/sub 2/ concentration was observed in the range of 100-10000 ppm.