{"title":"二氧化硅薄膜中的应力感应电流","authors":"R. Moazzami, C. Hu","doi":"10.1109/IEDM.1992.307327","DOIUrl":null,"url":null,"abstract":"Low-field current following Fowler-Nordheim stress of thin gate oxides is studied. The conduction mechanism is attributed to trap-assisted tunneling of electrons. For oxides thicker than 100 AA, this stress-induced current is observed to decay as traps are filled without significant tunneling out of traps. In thinner oxides, steady-state current flows when there is an equilibrium between trap filling and emptying processes. This model is observed to be consistent with stress-induced current behavior in a wide range of oxide thicknesses (60 AA to 130 AA) and process technologies.<<ETX>>","PeriodicalId":287098,"journal":{"name":"1992 International Technical Digest on Electron Devices Meeting","volume":"12 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"192","resultStr":"{\"title\":\"Stress-induced current in thin silicon dioxide films\",\"authors\":\"R. Moazzami, C. Hu\",\"doi\":\"10.1109/IEDM.1992.307327\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Low-field current following Fowler-Nordheim stress of thin gate oxides is studied. The conduction mechanism is attributed to trap-assisted tunneling of electrons. For oxides thicker than 100 AA, this stress-induced current is observed to decay as traps are filled without significant tunneling out of traps. In thinner oxides, steady-state current flows when there is an equilibrium between trap filling and emptying processes. This model is observed to be consistent with stress-induced current behavior in a wide range of oxide thicknesses (60 AA to 130 AA) and process technologies.<<ETX>>\",\"PeriodicalId\":287098,\"journal\":{\"name\":\"1992 International Technical Digest on Electron Devices Meeting\",\"volume\":\"12 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"192\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1992 International Technical Digest on Electron Devices Meeting\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEDM.1992.307327\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1992 International Technical Digest on Electron Devices Meeting","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEDM.1992.307327","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Stress-induced current in thin silicon dioxide films
Low-field current following Fowler-Nordheim stress of thin gate oxides is studied. The conduction mechanism is attributed to trap-assisted tunneling of electrons. For oxides thicker than 100 AA, this stress-induced current is observed to decay as traps are filled without significant tunneling out of traps. In thinner oxides, steady-state current flows when there is an equilibrium between trap filling and emptying processes. This model is observed to be consistent with stress-induced current behavior in a wide range of oxide thicknesses (60 AA to 130 AA) and process technologies.<>
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