{"title":"互连路由变化对信号退化影响的快速分析","authors":"J. Ochoa, A. Cangellaris","doi":"10.1109/EPEPS.2012.6457905","DOIUrl":null,"url":null,"abstract":"A computer model is proposed for the fast predictive analysis of the impact of interconnect routing variability on their broadband signal transmission properties. Through the use of a multi-conductor transmission line model of the interconnect structure and rational function interpolation in the frequency domain, the proposed model propagates routing variability described in terms of a set of properly defined random variables to broadband, stochastic scattering parameters for the transmission channel. In this manner, an efficient Monte Carlo analysis can be performed for the prediction of the statistics of the transient response of the channel due to routing uncertainty.","PeriodicalId":188377,"journal":{"name":"2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems","volume":"6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"Fast analysis of the impact of interconnect routing variability on signal degradation\",\"authors\":\"J. Ochoa, A. Cangellaris\",\"doi\":\"10.1109/EPEPS.2012.6457905\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A computer model is proposed for the fast predictive analysis of the impact of interconnect routing variability on their broadband signal transmission properties. Through the use of a multi-conductor transmission line model of the interconnect structure and rational function interpolation in the frequency domain, the proposed model propagates routing variability described in terms of a set of properly defined random variables to broadband, stochastic scattering parameters for the transmission channel. In this manner, an efficient Monte Carlo analysis can be performed for the prediction of the statistics of the transient response of the channel due to routing uncertainty.\",\"PeriodicalId\":188377,\"journal\":{\"name\":\"2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems\",\"volume\":\"6 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPEPS.2012.6457905\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEPS.2012.6457905","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Fast analysis of the impact of interconnect routing variability on signal degradation
A computer model is proposed for the fast predictive analysis of the impact of interconnect routing variability on their broadband signal transmission properties. Through the use of a multi-conductor transmission line model of the interconnect structure and rational function interpolation in the frequency domain, the proposed model propagates routing variability described in terms of a set of properly defined random variables to broadband, stochastic scattering parameters for the transmission channel. In this manner, an efficient Monte Carlo analysis can be performed for the prediction of the statistics of the transient response of the channel due to routing uncertainty.