{"title":"瞬态-数字转换器检测电快速瞬态(EFT)扰动,用于系统保护设计","authors":"Cheng-Cheng Yen, Wan-Yen Lin, M. Ker, Ching-Ling Tsai, Shih-Fan Chen, Tung-Yang Chen","doi":"10.1109/ICICDT.2011.5783183","DOIUrl":null,"url":null,"abstract":"New on-chip 4-bit transient-to-digital converter for electrical fast transient (EFT) protection design has been proposed. The converter is designed to detect EFT-induced transient disturbances and transfer different EFT voltages into digital codes under EFT tests. The experimental results in silicon chip have confirmed the successful digital output codes.","PeriodicalId":402000,"journal":{"name":"2011 IEEE International Conference on IC Design & Technology","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-05-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Transient-to-digital converter to detect electrical fast transient (EFT) disturbance for system protection design\",\"authors\":\"Cheng-Cheng Yen, Wan-Yen Lin, M. Ker, Ching-Ling Tsai, Shih-Fan Chen, Tung-Yang Chen\",\"doi\":\"10.1109/ICICDT.2011.5783183\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"New on-chip 4-bit transient-to-digital converter for electrical fast transient (EFT) protection design has been proposed. The converter is designed to detect EFT-induced transient disturbances and transfer different EFT voltages into digital codes under EFT tests. The experimental results in silicon chip have confirmed the successful digital output codes.\",\"PeriodicalId\":402000,\"journal\":{\"name\":\"2011 IEEE International Conference on IC Design & Technology\",\"volume\":\"5 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-05-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 IEEE International Conference on IC Design & Technology\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICICDT.2011.5783183\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 IEEE International Conference on IC Design & Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICICDT.2011.5783183","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Transient-to-digital converter to detect electrical fast transient (EFT) disturbance for system protection design
New on-chip 4-bit transient-to-digital converter for electrical fast transient (EFT) protection design has been proposed. The converter is designed to detect EFT-induced transient disturbances and transfer different EFT voltages into digital codes under EFT tests. The experimental results in silicon chip have confirmed the successful digital output codes.