瞬态-数字转换器检测电快速瞬态(EFT)扰动,用于系统保护设计

Cheng-Cheng Yen, Wan-Yen Lin, M. Ker, Ching-Ling Tsai, Shih-Fan Chen, Tung-Yang Chen
{"title":"瞬态-数字转换器检测电快速瞬态(EFT)扰动,用于系统保护设计","authors":"Cheng-Cheng Yen, Wan-Yen Lin, M. Ker, Ching-Ling Tsai, Shih-Fan Chen, Tung-Yang Chen","doi":"10.1109/ICICDT.2011.5783183","DOIUrl":null,"url":null,"abstract":"New on-chip 4-bit transient-to-digital converter for electrical fast transient (EFT) protection design has been proposed. The converter is designed to detect EFT-induced transient disturbances and transfer different EFT voltages into digital codes under EFT tests. The experimental results in silicon chip have confirmed the successful digital output codes.","PeriodicalId":402000,"journal":{"name":"2011 IEEE International Conference on IC Design & Technology","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-05-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Transient-to-digital converter to detect electrical fast transient (EFT) disturbance for system protection design\",\"authors\":\"Cheng-Cheng Yen, Wan-Yen Lin, M. Ker, Ching-Ling Tsai, Shih-Fan Chen, Tung-Yang Chen\",\"doi\":\"10.1109/ICICDT.2011.5783183\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"New on-chip 4-bit transient-to-digital converter for electrical fast transient (EFT) protection design has been proposed. The converter is designed to detect EFT-induced transient disturbances and transfer different EFT voltages into digital codes under EFT tests. The experimental results in silicon chip have confirmed the successful digital output codes.\",\"PeriodicalId\":402000,\"journal\":{\"name\":\"2011 IEEE International Conference on IC Design & Technology\",\"volume\":\"5 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-05-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 IEEE International Conference on IC Design & Technology\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICICDT.2011.5783183\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 IEEE International Conference on IC Design & Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICICDT.2011.5783183","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

提出了一种用于电快速瞬变(EFT)保护设计的新型片上4位瞬变-数字转换器。该变换器的设计目的是检测电动势引起的瞬态干扰,并在电动势测试中将不同的电动势电压转换成数字代码。在硅芯片上的实验结果证实了该数字输出码的成功。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Transient-to-digital converter to detect electrical fast transient (EFT) disturbance for system protection design
New on-chip 4-bit transient-to-digital converter for electrical fast transient (EFT) protection design has been proposed. The converter is designed to detect EFT-induced transient disturbances and transfer different EFT voltages into digital codes under EFT tests. The experimental results in silicon chip have confirmed the successful digital output codes.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信