红外探测器用PbS量子点/ ZnO纳米线混合测试结构

2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) Pub Date : 2019-03-01 DOI:10.1109/ICMTS.2019.8730956

Haibin Wang, A. Higo, Y. Mita, T. Kubo, H. Segawa

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引用次数: 3

摘要

为了开发与硅基大规模集成兼容的红外光电器件，我们采用几种不同的测试结构研究了PbS胶体量子点-硅光电探测器的性能。研究了由PbS量子点/ ZnO纳米线组成的硅基红外探测器结构。

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PbS Quantum Dot / ZnO Nanowires Hybrid Test Structures for Infrared Photodetector

Aiming at developing infrared optoelectronic devices compatible with silicon-based large scale integration, we investigated performance of PbS colloidal quantum dot-silicon photodetectors using several different test structures. Silicon-based IR photo detector structures composed of PbS quantum dot / ZnO nanowire were investigated.

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来源期刊

2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS)

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