{"title":"生成具有全输出-传播特性的紧迁移测试的伪布尔技术","authors":"T. Iwagaki, M. Kaneko","doi":"10.1109/DELTA.2010.58","DOIUrl":null,"url":null,"abstract":"This paper presents a technique for deriving a test set that detects each transition fault at all the reachable outputs from the fault site. It is known that such tests, which are called all-output-propagation (AOP) ones, can enhance the detectability of un-modeled defects. In order to generate compact AOP tests, pseudo-Boolean (0-1 integer programming) model is introduced in this paper. Moreover, a simple and reasonable heuristic way is also introduced to reduce the size of AOP tests efficiently.It is shown that the proposed method can generate compact AOP tests in a reasonable amount of test generation time through some experiments.","PeriodicalId":421336,"journal":{"name":"2010 Fifth IEEE International Symposium on Electronic Design, Test & Applications","volume":"58 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-01-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A Pseudo-Boolean Technique for Generating Compact Transition Tests with All-Output-Propagation Properties\",\"authors\":\"T. Iwagaki, M. Kaneko\",\"doi\":\"10.1109/DELTA.2010.58\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a technique for deriving a test set that detects each transition fault at all the reachable outputs from the fault site. It is known that such tests, which are called all-output-propagation (AOP) ones, can enhance the detectability of un-modeled defects. In order to generate compact AOP tests, pseudo-Boolean (0-1 integer programming) model is introduced in this paper. Moreover, a simple and reasonable heuristic way is also introduced to reduce the size of AOP tests efficiently.It is shown that the proposed method can generate compact AOP tests in a reasonable amount of test generation time through some experiments.\",\"PeriodicalId\":421336,\"journal\":{\"name\":\"2010 Fifth IEEE International Symposium on Electronic Design, Test & Applications\",\"volume\":\"58 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-01-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 Fifth IEEE International Symposium on Electronic Design, Test & Applications\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DELTA.2010.58\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 Fifth IEEE International Symposium on Electronic Design, Test & Applications","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DELTA.2010.58","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A Pseudo-Boolean Technique for Generating Compact Transition Tests with All-Output-Propagation Properties
This paper presents a technique for deriving a test set that detects each transition fault at all the reachable outputs from the fault site. It is known that such tests, which are called all-output-propagation (AOP) ones, can enhance the detectability of un-modeled defects. In order to generate compact AOP tests, pseudo-Boolean (0-1 integer programming) model is introduced in this paper. Moreover, a simple and reasonable heuristic way is also introduced to reduce the size of AOP tests efficiently.It is shown that the proposed method can generate compact AOP tests in a reasonable amount of test generation time through some experiments.