{"title":"定向纳米孪晶铜直接键合铜,时间短,电性能优异","authors":"K. Shie, J. Juang, Chih Chen","doi":"10.23919/LTB-3D.2019.8735201","DOIUrl":null,"url":null,"abstract":"In order to be compatible with semiconductor manufacturing, nanotwinned Cu microbumps were fabricated on 8” wafers. The pair of top and bottom dies were jointed through thermal compression bonding. After 1 min bonding time, the resistance could obtaine from all test structures, which indicates all the microbumps were bonded in the short time successfully.","PeriodicalId":256720,"journal":{"name":"2019 6th International Workshop on Low Temperature Bonding for 3D Integration (LTB-3D)","volume":"72 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Copper direct bonding with short time and excellent electrical property by <111>-oriented nano-twinned copper\",\"authors\":\"K. Shie, J. Juang, Chih Chen\",\"doi\":\"10.23919/LTB-3D.2019.8735201\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In order to be compatible with semiconductor manufacturing, nanotwinned Cu microbumps were fabricated on 8” wafers. The pair of top and bottom dies were jointed through thermal compression bonding. After 1 min bonding time, the resistance could obtaine from all test structures, which indicates all the microbumps were bonded in the short time successfully.\",\"PeriodicalId\":256720,\"journal\":{\"name\":\"2019 6th International Workshop on Low Temperature Bonding for 3D Integration (LTB-3D)\",\"volume\":\"72 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 6th International Workshop on Low Temperature Bonding for 3D Integration (LTB-3D)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.23919/LTB-3D.2019.8735201\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 6th International Workshop on Low Temperature Bonding for 3D Integration (LTB-3D)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/LTB-3D.2019.8735201","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Copper direct bonding with short time and excellent electrical property by <111>-oriented nano-twinned copper
In order to be compatible with semiconductor manufacturing, nanotwinned Cu microbumps were fabricated on 8” wafers. The pair of top and bottom dies were jointed through thermal compression bonding. After 1 min bonding time, the resistance could obtaine from all test structures, which indicates all the microbumps were bonded in the short time successfully.