采用低熔点SnBi基锡膏LMPA-Q提高QFN热循环可靠性

B. Vandevelde, R. Labie, R. Lauwaert, Daniel Werkhoven, D. Vanderstraeten, E. Blansaer, Jonas Lannoo, D. Pissoort
{"title":"采用低熔点SnBi基锡膏LMPA-Q提高QFN热循环可靠性","authors":"B. Vandevelde, R. Labie, R. Lauwaert, Daniel Werkhoven, D. Vanderstraeten, E. Blansaer, Jonas Lannoo, D. Pissoort","doi":"10.1109/EUROSIME.2019.8724511","DOIUrl":null,"url":null,"abstract":"In this work, the solder joint reliability of QFN components is experimentally tested in thermal cycling and four-point bending cycling conditions, and this for three different solder materials: standard SAC305, low Ag SAC alloy and a new low melting temperature SnBi based alloy LMPA-Q. The outcome of the study is to evaluate if these new SnBi based solder material perform similar, worse or better than the more standard lead-free solders.","PeriodicalId":357224,"journal":{"name":"2019 20th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)","volume":" 45","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Improved QFN thermal cycling reliability using low melting temperature SnBi based solder paste LMPA-Q\",\"authors\":\"B. Vandevelde, R. Labie, R. Lauwaert, Daniel Werkhoven, D. Vanderstraeten, E. Blansaer, Jonas Lannoo, D. Pissoort\",\"doi\":\"10.1109/EUROSIME.2019.8724511\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this work, the solder joint reliability of QFN components is experimentally tested in thermal cycling and four-point bending cycling conditions, and this for three different solder materials: standard SAC305, low Ag SAC alloy and a new low melting temperature SnBi based alloy LMPA-Q. The outcome of the study is to evaluate if these new SnBi based solder material perform similar, worse or better than the more standard lead-free solders.\",\"PeriodicalId\":357224,\"journal\":{\"name\":\"2019 20th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)\",\"volume\":\" 45\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-03-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 20th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EUROSIME.2019.8724511\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 20th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EUROSIME.2019.8724511","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4

摘要

在本工作中,对QFN组件的焊点可靠性进行了热循环和四点弯曲循环条件下的实验测试,并对三种不同的焊料材料:标准SAC305,低Ag SAC合金和新型低熔点SnBi基合金LMPA-Q进行了测试。研究的结果是评估这些新的SnBi基焊料材料的性能是否与更标准的无铅焊料相似,更差或更好。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Improved QFN thermal cycling reliability using low melting temperature SnBi based solder paste LMPA-Q
In this work, the solder joint reliability of QFN components is experimentally tested in thermal cycling and four-point bending cycling conditions, and this for three different solder materials: standard SAC305, low Ag SAC alloy and a new low melting temperature SnBi based alloy LMPA-Q. The outcome of the study is to evaluate if these new SnBi based solder material perform similar, worse or better than the more standard lead-free solders.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信