{"title":"毫米波sige异质结晶体管几何可伸缩模型参数提取","authors":"A. Pawlak, M. Schroter, A. Fox","doi":"10.1109/BCTM.2013.6798160","DOIUrl":null,"url":null,"abstract":"The observation of negative perimeter collector current in advanced SiGe HBT technologies is explained and a general geometry scaling approach is proposed. Application to mm-wave SiGe-HBTs shows excellent results of HICUM/L2 v2.31 for a wide range of emitter dimensions. Non-monotonic variation of peak fT with emitter dimensions demonstrates the relevance of a geometry scalable compact model for circuit optimization.","PeriodicalId":272941,"journal":{"name":"2013 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"Geometry scalable model parameter extraction for mm-wave SiGe-heterojunction transistors\",\"authors\":\"A. Pawlak, M. Schroter, A. Fox\",\"doi\":\"10.1109/BCTM.2013.6798160\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The observation of negative perimeter collector current in advanced SiGe HBT technologies is explained and a general geometry scaling approach is proposed. Application to mm-wave SiGe-HBTs shows excellent results of HICUM/L2 v2.31 for a wide range of emitter dimensions. Non-monotonic variation of peak fT with emitter dimensions demonstrates the relevance of a geometry scalable compact model for circuit optimization.\",\"PeriodicalId\":272941,\"journal\":{\"name\":\"2013 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM)\",\"volume\":\"11 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/BCTM.2013.6798160\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/BCTM.2013.6798160","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Geometry scalable model parameter extraction for mm-wave SiGe-heterojunction transistors
The observation of negative perimeter collector current in advanced SiGe HBT technologies is explained and a general geometry scaling approach is proposed. Application to mm-wave SiGe-HBTs shows excellent results of HICUM/L2 v2.31 for a wide range of emitter dimensions. Non-monotonic variation of peak fT with emitter dimensions demonstrates the relevance of a geometry scalable compact model for circuit optimization.