高分辨率全数字锁相环及其应用于内存内置速度分级

H. Hsu, Chun-Chieh Tu, Shi-Yu Huang
{"title":"高分辨率全数字锁相环及其应用于内存内置速度分级","authors":"H. Hsu, Chun-Chieh Tu, Shi-Yu Huang","doi":"10.1109/VDAT.2008.4542464","DOIUrl":null,"url":null,"abstract":"In this paper we present a high-resolution and wide-range all-digital phase-locked loop (ADPLL), which is suitable to function as a clock generator. The digitally controlled oscillator (DCO) is able to operate from 70 to 725 MHz and achieves 5.2ps resolution. The phase-frequency detector (PFD) is designed using a latch-based sense amplifier, leading to a nearly perfect PFD that is able to resolve a phase difference as minute as only 1ps. In addition, we use this ADPLL as a vehicle to perform built-in speed grading (BISG) for memory. Combining a binary search process with multiple runs of built-in self-test (BIST), the maximum operating speed can thus be tracked down on the chip with a high precision.","PeriodicalId":156790,"journal":{"name":"2008 IEEE International Symposium on VLSI Design, Automation and Test (VLSI-DAT)","volume":"124 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-04-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"18","resultStr":"{\"title\":\"A high-resolution all-digital phase-locked loop with its application to built-in speed grading for memory\",\"authors\":\"H. Hsu, Chun-Chieh Tu, Shi-Yu Huang\",\"doi\":\"10.1109/VDAT.2008.4542464\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper we present a high-resolution and wide-range all-digital phase-locked loop (ADPLL), which is suitable to function as a clock generator. The digitally controlled oscillator (DCO) is able to operate from 70 to 725 MHz and achieves 5.2ps resolution. The phase-frequency detector (PFD) is designed using a latch-based sense amplifier, leading to a nearly perfect PFD that is able to resolve a phase difference as minute as only 1ps. In addition, we use this ADPLL as a vehicle to perform built-in speed grading (BISG) for memory. Combining a binary search process with multiple runs of built-in self-test (BIST), the maximum operating speed can thus be tracked down on the chip with a high precision.\",\"PeriodicalId\":156790,\"journal\":{\"name\":\"2008 IEEE International Symposium on VLSI Design, Automation and Test (VLSI-DAT)\",\"volume\":\"124 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-04-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"18\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 IEEE International Symposium on VLSI Design, Automation and Test (VLSI-DAT)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VDAT.2008.4542464\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 IEEE International Symposium on VLSI Design, Automation and Test (VLSI-DAT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VDAT.2008.4542464","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 18

摘要

本文设计了一种高分辨率、宽量程的全数字锁相环(ADPLL),适合作为时钟发生器。数字控制振荡器(DCO)能够在70至725 MHz范围内工作,并实现5.2ps分辨率。相位频率检测器(PFD)采用基于锁存器的感测放大器设计,使得PFD几乎完美,能够分辨小至1ps的相位差。此外,我们使用该ADPLL作为执行内存内置速度分级(BISG)的载体。将二进制搜索过程与多次运行的内置自检(BIST)相结合,可以高精度地在芯片上跟踪最大运行速度。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A high-resolution all-digital phase-locked loop with its application to built-in speed grading for memory
In this paper we present a high-resolution and wide-range all-digital phase-locked loop (ADPLL), which is suitable to function as a clock generator. The digitally controlled oscillator (DCO) is able to operate from 70 to 725 MHz and achieves 5.2ps resolution. The phase-frequency detector (PFD) is designed using a latch-based sense amplifier, leading to a nearly perfect PFD that is able to resolve a phase difference as minute as only 1ps. In addition, we use this ADPLL as a vehicle to perform built-in speed grading (BISG) for memory. Combining a binary search process with multiple runs of built-in self-test (BIST), the maximum operating speed can thus be tracked down on the chip with a high precision.
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