{"title":"在大学进行设计和测试","authors":"S. Al-Arian","doi":"10.1109/TEST.1989.82301","DOIUrl":null,"url":null,"abstract":"It is argued that a broad-based VLSI curriculum should be established in the university. In conjunction with theoretical teaching, facilities that include an integrated design and test environment, CAD tools, and ATE (automatic test equipment) should be provided. A possible program might be directed toward the computer (or electrical) engineering degree with emphasis on VLSI design and testing. The areas that might be included in such a program are design and architecture, device physics and technology, integrated circuits, testing and fault tolerance, CAD tools, algorithms and applications, and processing techniques.<<ETX>>","PeriodicalId":264111,"journal":{"name":"Proceedings. 'Meeting the Tests of Time'., International Test Conference","volume":"38 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-08-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Design and test in the universities\",\"authors\":\"S. Al-Arian\",\"doi\":\"10.1109/TEST.1989.82301\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"It is argued that a broad-based VLSI curriculum should be established in the university. In conjunction with theoretical teaching, facilities that include an integrated design and test environment, CAD tools, and ATE (automatic test equipment) should be provided. A possible program might be directed toward the computer (or electrical) engineering degree with emphasis on VLSI design and testing. The areas that might be included in such a program are design and architecture, device physics and technology, integrated circuits, testing and fault tolerance, CAD tools, algorithms and applications, and processing techniques.<<ETX>>\",\"PeriodicalId\":264111,\"journal\":{\"name\":\"Proceedings. 'Meeting the Tests of Time'., International Test Conference\",\"volume\":\"38 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1989-08-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings. 'Meeting the Tests of Time'., International Test Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.1989.82301\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings. 'Meeting the Tests of Time'., International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1989.82301","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
It is argued that a broad-based VLSI curriculum should be established in the university. In conjunction with theoretical teaching, facilities that include an integrated design and test environment, CAD tools, and ATE (automatic test equipment) should be provided. A possible program might be directed toward the computer (or electrical) engineering degree with emphasis on VLSI design and testing. The areas that might be included in such a program are design and architecture, device physics and technology, integrated circuits, testing and fault tolerance, CAD tools, algorithms and applications, and processing techniques.<>