缺陷诊断-推理方法

Yasuo Sato, Kazushi Sugiura, Reisuke Shimoda, Yutaka Yoshizawa, Kenji Norimatsu, M. Sanada
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引用次数: 8

摘要

诊断已成为早期调试和提高成品率的关键技术。然而,传统的故障诊断方法不能很好地定位不能用逻辑故障模型精确表达的缺陷。本文提出了一种基于物理信息对缺陷行为进行评价的缺陷诊断方法。我们通过比较观察到的ATE反应来检查可疑节点的电压。在检测中,我们使用了“缺陷激活”,这是一种利用物理信息估计缺陷节点电压的方法。使用这种方法,我们介绍了诊断细胞中开放缺陷和互连开放缺陷的例子。这些成功的结果表明了缺陷诊断的有效性
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Defect Diagnosis - Reasoning Methodology
Diagnosis has become a crucial technology for early debugging and yield improvement. However, the conventional diagnosis methods are not good at locating the defects that are not precisely expressed only with logical fault models. In this paper, we propose a novel defect diagnosis methodology, which is based on the evaluation of defect behaviors using physical information. We examine suspected nodes' voltages by comparing with the observed responses of ATE. In the examination, we use "defect activation", which is an estimation method of defective nodes' voltages using physical information. Using this methodology, we introduce examples of diagnosis for open defects in a cell, and for interconnect open defects. Those successful results show the effectiveness of the defect diagnosis
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