液晶显示器(LCD)面板互连系统中电气超应力(EOS)失效机制的思考

2010 34th IEEE/CPMT International Electronic Manufacturing Technology Symposium (IEMT) Pub Date : 2010-11-01 DOI:10.1109/IEMT.2010.5746676

Jae-Hyung Kim, Dong-Nam Kim, Hoon Jang, Young-Chul Jo, Nam-Yong Kim, Seung-Geun Kang, Byung-Ju Lee, Dal-Soo Kim

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引用次数: 1

摘要

集成电路行业已经为电气超应力(EOS)损坏付出了大量的质量成本。本文描述了寻找EOS源的失效分析程序和验证与印刷电路板互连的LCD面板子系统失效机理的实验方法。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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A consideration on the Electrical Overstress(EOS) failure mechanism in the interconnection system of liquid crystal display(LCD) panel

The IC industry has been paid a large amount of quality cost for Electrical Overstress(EOS) damages. This paper described the failure analysis procedure to find EOS source and the experimental methodology to verify the failure mechanism in the subsystems of the LCD panel interconnected with printed circuit boards.

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来源期刊

2010 34th IEEE/CPMT International Electronic Manufacturing Technology Symposium (IEMT)

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