逻辑电路中单比特和多比特错误的并发检测方案

B. Kolla, P. Lala, K. Yarlagadda
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引用次数: 1

摘要

提出了一种利用剩余码检测单比特和多比特(单向和双向)错误的新方案。该程序已应用于输出高达8位的电路。实验表明,使用该方案可以检测出99%的多比特错误
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A concurrent checking scheme for single and multibit errors in logic circuits
A new scheme for detecting single and multibit (unidirectional and bidirectional) errors using residue codes has been proposed. This procedure has been applied to circuits with outputs up to 8 bits. It has been shown that about 99% of all multibit errors can be detected using this scheme.<>
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