P. Sharma, B. Smith, D. Hall, M. Nelson, U. Lohani
{"title":"电平移位器Si验证的高效技术","authors":"P. Sharma, B. Smith, D. Hall, M. Nelson, U. Lohani","doi":"10.1109/ICMTS.2013.6528173","DOIUrl":null,"url":null,"abstract":"This paper presents a new structure that uses an addressable parametric array to validate level shifter cells. This structure is very area efficient and allows direct measurement of input and output voltages. Being a parametric structure enabled direct measurement of the output voltages, a critical parameter for level shifters. Experimental data confirmed the utility of this approach, validating level shifters in three different power domains including source biasing on the same 22-pad design. The simulation results show good correlation with the measured data.","PeriodicalId":142589,"journal":{"name":"2013 IEEE International Conference on Microelectronic Test Structures (ICMTS)","volume":"23 6","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-03-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Efficient technique for Si validation of level shifters\",\"authors\":\"P. Sharma, B. Smith, D. Hall, M. Nelson, U. Lohani\",\"doi\":\"10.1109/ICMTS.2013.6528173\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a new structure that uses an addressable parametric array to validate level shifter cells. This structure is very area efficient and allows direct measurement of input and output voltages. Being a parametric structure enabled direct measurement of the output voltages, a critical parameter for level shifters. Experimental data confirmed the utility of this approach, validating level shifters in three different power domains including source biasing on the same 22-pad design. The simulation results show good correlation with the measured data.\",\"PeriodicalId\":142589,\"journal\":{\"name\":\"2013 IEEE International Conference on Microelectronic Test Structures (ICMTS)\",\"volume\":\"23 6\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-03-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 IEEE International Conference on Microelectronic Test Structures (ICMTS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICMTS.2013.6528173\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 IEEE International Conference on Microelectronic Test Structures (ICMTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICMTS.2013.6528173","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Efficient technique for Si validation of level shifters
This paper presents a new structure that uses an addressable parametric array to validate level shifter cells. This structure is very area efficient and allows direct measurement of input and output voltages. Being a parametric structure enabled direct measurement of the output voltages, a critical parameter for level shifters. Experimental data confirmed the utility of this approach, validating level shifters in three different power domains including source biasing on the same 22-pad design. The simulation results show good correlation with the measured data.
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