用于混合信号应用的200mm SiGe-HBT BiCMOS技术

D. Nguyen-ngoc, D. Harame, J. Malinowski, S. Jeng, K. Schonenberg, M. Gilbert, G. Berg, S. Wu, M. Soyuer, K. Tallman, K. Stein, R. Groves, S. Subbanna, D. Colavito, D. Sunderland, B. Meyerson
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引用次数: 26

摘要

在200 mm晶圆上实现了包括0.25 /spl mu/m电通道长度(L/sub EFF/) nFET和pFET CMOS器件和60 GHz f/sub max/ SiGe-HBT晶体管的BiCMOS技术。CMOS电路和SiGe-HBT模拟电路在同一芯片上制造,以展示该技术的高集成能力。CMOS电路包括CMOS环形振荡器和64 k SRAM,单元尺寸为34 /spl mu/m/sup 2/ cell。SiGe-HBT电路包括ECL环形振荡器和一个压控振荡器(VCO)。这是迄今为止任何sige基双极技术实现的最高集成水平。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A 200 mm SiGe-HBT BiCMOS technology for mixed signal applications
A BiCMOS technology including 0.25 /spl mu/m electrical channel length (L/sub EFF/) nFET and pFET CMOS devices and 60 GHz f/sub max/ SiGe-HBT transistors has been achieved on 200 mm wafers. Both CMOS circuits and SiGe-HBT analog circuits were fabricated on the same chip to demonstrate the high integration capabilities of the technology. The CMOS circuits include CMOS ring oscillators and a 64 k SRAM with a 34 /spl mu/m/sup 2/ cell size. The SiGe-HBT circuits include ECL ring oscillators and a Voltage Controlled Oscillator (VCO). This is the highest level of integration yet achieved for any SiGe-base bipolar technology.
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