{"title":"一种改进的成对测试用例生成方法","authors":"Qian Feng-an, Jiang Jian-hui","doi":"10.1109/ATS.2007.65","DOIUrl":null,"url":null,"abstract":"Pair-wise testing is a testing criterion based on specification, which requires that for each pair of parameters, every combination of their valid value should be covered by at least one test case in the test set. This paper presents an improved method based on AETG. Experimental results show that the size of test set produced by our method is relatively small. In addition, the method can be easily implemented.","PeriodicalId":289969,"journal":{"name":"16th Asian Test Symposium (ATS 2007)","volume":"797 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-10-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"An Improved Test Case Generation Method of Pair-Wise Testing\",\"authors\":\"Qian Feng-an, Jiang Jian-hui\",\"doi\":\"10.1109/ATS.2007.65\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Pair-wise testing is a testing criterion based on specification, which requires that for each pair of parameters, every combination of their valid value should be covered by at least one test case in the test set. This paper presents an improved method based on AETG. Experimental results show that the size of test set produced by our method is relatively small. In addition, the method can be easily implemented.\",\"PeriodicalId\":289969,\"journal\":{\"name\":\"16th Asian Test Symposium (ATS 2007)\",\"volume\":\"797 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-10-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"16th Asian Test Symposium (ATS 2007)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATS.2007.65\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"16th Asian Test Symposium (ATS 2007)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.2007.65","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An Improved Test Case Generation Method of Pair-Wise Testing
Pair-wise testing is a testing criterion based on specification, which requires that for each pair of parameters, every combination of their valid value should be covered by at least one test case in the test set. This paper presents an improved method based on AETG. Experimental results show that the size of test set produced by our method is relatively small. In addition, the method can be easily implemented.