激光电压探测组合逻辑分析案例研究

2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Pub Date : 2016-07-18 DOI:10.1109/IPFA.2016.7564246

Winson Lua, G. Ranganathan, V. Ravikumar, Angeline Phoa

{"title":"激光电压探测组合逻辑分析案例研究","authors":"Winson Lua, G. Ranganathan, V. Ravikumar, Angeline Phoa","doi":"10.1109/IPFA.2016.7564246","DOIUrl":null,"url":null,"abstract":"Combinational logic analysis has been introduced to improve fault isolation when using laser voltage probing on standard cells. The technique has been shown to offer more reliable isolation within a shorter time thereby increasing FI efficiency. This paper uses interesting case studies to showcase how incorporating into conventional laser voltage probing significantly improves the success rate of failure analysis.","PeriodicalId":206237,"journal":{"name":"2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-07-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"Combinational logic analysis case studies using laser voltage probing\",\"authors\":\"Winson Lua, G. Ranganathan, V. Ravikumar, Angeline Phoa\",\"doi\":\"10.1109/IPFA.2016.7564246\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Combinational logic analysis has been introduced to improve fault isolation when using laser voltage probing on standard cells. The technique has been shown to offer more reliable isolation within a shorter time thereby increasing FI efficiency. This paper uses interesting case studies to showcase how incorporating into conventional laser voltage probing significantly improves the success rate of failure analysis.\",\"PeriodicalId\":206237,\"journal\":{\"name\":\"2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)\",\"volume\":\"18 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-07-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IPFA.2016.7564246\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IPFA.2016.7564246","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 6

摘要

采用组合逻辑分析方法对标准电池进行激光电压探测时，提高了故障隔离性。该技术已被证明可以在更短的时间内提供更可靠的隔离，从而提高FI效率。本文使用有趣的案例研究来展示如何将其纳入传统的激光电压探测中，从而显著提高故障分析的成功率。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Combinational logic analysis case studies using laser voltage probing

Combinational logic analysis has been introduced to improve fault isolation when using laser voltage probing on standard cells. The technique has been shown to offer more reliable isolation within a shorter time thereby increasing FI efficiency. This paper uses interesting case studies to showcase how incorporating into conventional laser voltage probing significantly improves the success rate of failure analysis.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

自引率

0.00%

发文量