提出了一种一维无源阵列并行开尔文测量电路，具有有效的面积利用率

2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) Pub Date : 2019-03-01 DOI:10.1109/ICMTS.2019.8730948

Matthew Rerecich, C. Young

{"title":"提出了一种一维无源阵列并行开尔文测量电路，具有有效的面积利用率","authors":"Matthew Rerecich, C. Young","doi":"10.1109/ICMTS.2019.8730948","DOIUrl":null,"url":null,"abstract":"A test structure and measurement method are proposed that permits measurement of several resistors in parallel using a kelvin method with only two independent pads per device. This technique allows rapid measurement of several different resistors with efficient area usage and a simple and adaptable circuit architecture.","PeriodicalId":333915,"journal":{"name":"2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS)","volume":"28 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Proposed one-dimensional passive array test circuit for parallel kelvin measurement with efficient area use\",\"authors\":\"Matthew Rerecich, C. Young\",\"doi\":\"10.1109/ICMTS.2019.8730948\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A test structure and measurement method are proposed that permits measurement of several resistors in parallel using a kelvin method with only two independent pads per device. This technique allows rapid measurement of several different resistors with efficient area usage and a simple and adaptable circuit architecture.\",\"PeriodicalId\":333915,\"journal\":{\"name\":\"2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS)\",\"volume\":\"28 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-03-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICMTS.2019.8730948\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICMTS.2019.8730948","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 1

摘要

提出了一种测试结构和测量方法，允许使用开尔文方法并行测量多个电阻，每个器件只有两个独立的焊盘。该技术可以快速测量几种不同的电阻，具有有效的面积使用和简单且适应性强的电路结构。

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Proposed one-dimensional passive array test circuit for parallel kelvin measurement with efficient area use

A test structure and measurement method are proposed that permits measurement of several resistors in parallel using a kelvin method with only two independent pads per device. This technique allows rapid measurement of several different resistors with efficient area usage and a simple and adaptable circuit architecture.

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来源期刊

2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS)

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