基于多路复用器的移位器路径延迟故障测试

Proceedings Ninth Great Lakes Symposium on VLSI Pub Date : 1999-03-04 DOI:10.1080/00207210110058139

H. T. Vergos, D. Nikolos, Y. Tsiatouhas, T. Haniotakis, M. Nicolaidis

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引用次数: 0

摘要

本文提出了一种基于多路复用器的移位器路径延迟故障检测方法。我们证明了移位器的许多路径是不可鲁棒可测试的，并给出了一种路径选择方法，使得所有选择的路径都可以通过20*log/sub 2/n+2对测试向量进行鲁棒可测试，其中n为移位器的长度。沿着所有其他路径的传播延迟是沿着所选路径的延迟的函数。

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On path delay fault testing of multiplexer-based shifters

In this paper we present a method for path delay fault testing of multiplexer-based shifters. We show that many paths of the shifter are non-robustly testable and we give a path selection method so as all the selected paths to be robustly testable by 20*log/sub 2/n+2 test-vector pairs, where n is the length of the shifter. The propagation delay along all other paths is a function of the delays along the selected paths.

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Proceedings Ninth Great Lakes Symposium on VLSI

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