一种27 GHz双多晶硅双极技术,在键合SOI上嵌入58 μ m/sup / CMOS存储单元,用于ECL-CMOS SRAM应用

T. Hiramoto, N. Tamba, M. Yoshida, T. Hashimoto, T. Fujiwara, K. Watanabe, M. Odaka, M. Usami, T. Ikeda
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引用次数: 20

摘要

提出了一种高速、高堆积密度、低功耗、高粒子抗扰度的双多晶硅双极技术。采用键合SOI衬底来提高α粒子抗扰度,并引入缩放CMOS存储单元来降低功耗和增加封装密度。双极晶体管的截止频率高达27 GHz, CMOS存储单元的面积为58 μ m/sup /。该技术有望应用于ECL-CMOS方案的超高速高密度lsi。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A 27 GHz double polysilicon bipolar technology on bonded SOI with embedded 58 mu m/sup 2/ CMOS memory cells for ECL-CMOS SRAM applications
A double polysilicon bipolar technology with high-speed, high-packing density, low power consumption, and high alpha -particle immunity has been newly developed. Bonded SOI substrates are used to improve the alpha -particle immunity, and scaled CMOS memory cells are introduced to reduce the power consumption and to increase the packing density. The cut-off frequency of the bipolar transistors is as high as 27 GHz and the area of the CMOS memory cell is 58 mu m/sup 2/. This technology is promising for application to ultra high-speed, high-density LSIs with ECL-CMOS scheme.<>
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