极轨辐射强化电子记忆实验的单事件扰动结果

2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) Pub Date : 2020-11-01 DOI:10.1109/REDW51883.2020.9325847

D. Alexander, Alonzo Vera, Jeff Love, W. Morris, D. Gifford, Zach Daniels., Katharine Major, M. McHarg, P. Gresham, Ian Moffett, R. Cress, C. Maldonado, G. Wilson, R. L. Balthazor, J. Harley

{"title":"极轨辐射强化电子记忆实验的单事件扰动结果","authors":"D. Alexander, Alonzo Vera, Jeff Love, W. Morris, D. Gifford, Zach Daniels., Katharine Major, M. McHarg, P. Gresham, Ian Moffett, R. Cress, C. Maldonado, G. Wilson, R. L. Balthazor, J. Harley","doi":"10.1109/REDW51883.2020.9325847","DOIUrl":null,"url":null,"abstract":"Results are presented from the Radiation Hardened Electronic Memory Experiment (RHEME-2) performed on the STPSat-5 mission in a polar orbit.","PeriodicalId":127384,"journal":{"name":"2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Single Event Upset Results from the Radiation Hardened Electronic Memory Experiment in a Polar Orbit\",\"authors\":\"D. Alexander, Alonzo Vera, Jeff Love, W. Morris, D. Gifford, Zach Daniels., Katharine Major, M. McHarg, P. Gresham, Ian Moffett, R. Cress, C. Maldonado, G. Wilson, R. L. Balthazor, J. Harley\",\"doi\":\"10.1109/REDW51883.2020.9325847\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Results are presented from the Radiation Hardened Electronic Memory Experiment (RHEME-2) performed on the STPSat-5 mission in a polar orbit.\",\"PeriodicalId\":127384,\"journal\":{\"name\":\"2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)\",\"volume\":\"14 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/REDW51883.2020.9325847\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/REDW51883.2020.9325847","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}