用适当的正弦信号和采样频率进行非相干采样的精确ADC测试

Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Jianglin Wei, Takayuki Nakatani, Yujie Zhao, Shogo Katayama, Shuhei Yamamoto, A. Kuwana, K. Hatayama, Haruo Kobayashi
{"title":"用适当的正弦信号和采样频率进行非相干采样的精确ADC测试","authors":"Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Jianglin Wei, Takayuki Nakatani, Yujie Zhao, Shogo Katayama, Shuhei Yamamoto, A. Kuwana, K. Hatayama, Haruo Kobayashi","doi":"10.1109/ITC50571.2021.00038","DOIUrl":null,"url":null,"abstract":"This paper describes that the mature ADC testing method with a simple test system using the incoherent sampling and the standard algorithm of windowing and FFT with 4Kpoint data can measure the SINAD of our target 12-bit SAR ADC accurately by proper setting of the input and sampling frequencies, which is industry-friendly. We show the input sinusoidal signal and sampling clock frequency relationship for accurate testing of the ADC dynamic characteristics with an incoherent sampling method using a flat-top window. We have clarified the measured SINAD accuracy of the input signal frequency dependency for a fixed sampling frequency, a specified resolution of the ADC under test and a given number of FFT points (data samples) in the incoherent sampling environment. Mature technology combinations with their optimal usage and without advanced methods can lead to the low-cost high-quality testing of the ADC, which can be well accepted in industry. Their analysis, simulation and experimental results are shown.","PeriodicalId":147006,"journal":{"name":"2021 IEEE International Test Conference (ITC)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Revisit to Accurate ADC Testing with Incoherent Sampling Using Proper Sinusoidal Signal and Sampling Frequencies\",\"authors\":\"Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Jianglin Wei, Takayuki Nakatani, Yujie Zhao, Shogo Katayama, Shuhei Yamamoto, A. Kuwana, K. Hatayama, Haruo Kobayashi\",\"doi\":\"10.1109/ITC50571.2021.00038\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes that the mature ADC testing method with a simple test system using the incoherent sampling and the standard algorithm of windowing and FFT with 4Kpoint data can measure the SINAD of our target 12-bit SAR ADC accurately by proper setting of the input and sampling frequencies, which is industry-friendly. We show the input sinusoidal signal and sampling clock frequency relationship for accurate testing of the ADC dynamic characteristics with an incoherent sampling method using a flat-top window. We have clarified the measured SINAD accuracy of the input signal frequency dependency for a fixed sampling frequency, a specified resolution of the ADC under test and a given number of FFT points (data samples) in the incoherent sampling environment. Mature technology combinations with their optimal usage and without advanced methods can lead to the low-cost high-quality testing of the ADC, which can be well accepted in industry. Their analysis, simulation and experimental results are shown.\",\"PeriodicalId\":147006,\"journal\":{\"name\":\"2021 IEEE International Test Conference (ITC)\",\"volume\":\"10 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 IEEE International Test Conference (ITC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ITC50571.2021.00038\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE International Test Conference (ITC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ITC50571.2021.00038","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

本文介绍了成熟的ADC测试方法,通过一个简单的测试系统,采用非相干采样和标准的4 k点数据加窗和FFT算法,通过适当设置输入频率和采样频率,可以准确地测量我们的目标12位SAR ADC的SINAD,具有工业友好性。我们展示了输入正弦信号和采样时钟频率的关系,以便使用平顶窗的非相干采样方法精确测试ADC的动态特性。我们已经澄清了在非相干采样环境中,对于固定采样频率、被测ADC的指定分辨率和给定数量的FFT点(数据样本),输入信号频率依赖的测量SINAD精度。成熟的技术组合和它们的最佳使用,不需要先进的方法,可以实现低成本的高质量的ADC测试,这在工业上是可以接受的。给出了分析、仿真和实验结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Revisit to Accurate ADC Testing with Incoherent Sampling Using Proper Sinusoidal Signal and Sampling Frequencies
This paper describes that the mature ADC testing method with a simple test system using the incoherent sampling and the standard algorithm of windowing and FFT with 4Kpoint data can measure the SINAD of our target 12-bit SAR ADC accurately by proper setting of the input and sampling frequencies, which is industry-friendly. We show the input sinusoidal signal and sampling clock frequency relationship for accurate testing of the ADC dynamic characteristics with an incoherent sampling method using a flat-top window. We have clarified the measured SINAD accuracy of the input signal frequency dependency for a fixed sampling frequency, a specified resolution of the ADC under test and a given number of FFT points (data samples) in the incoherent sampling environment. Mature technology combinations with their optimal usage and without advanced methods can lead to the low-cost high-quality testing of the ADC, which can be well accepted in industry. Their analysis, simulation and experimental results are shown.
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