{"title":"失败分析的逻辑:莫尔格街20年的规则","authors":"G. Mura, M. Vanzi","doi":"10.1109/IPFA.2016.7564321","DOIUrl":null,"url":null,"abstract":"The logical rules of Failure Analysis, and their frequent violations are discussed. The joke of comparing Failure Analysis with a crime story, that prompted the seminal paper on 1995 and its follower in 2006, is here more directly explained in terms of good and bad practice.","PeriodicalId":206237,"journal":{"name":"2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)","volume":"32 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Logics of Failure Analysis: 20 Years of rules of the Rue Morgue\",\"authors\":\"G. Mura, M. Vanzi\",\"doi\":\"10.1109/IPFA.2016.7564321\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The logical rules of Failure Analysis, and their frequent violations are discussed. The joke of comparing Failure Analysis with a crime story, that prompted the seminal paper on 1995 and its follower in 2006, is here more directly explained in terms of good and bad practice.\",\"PeriodicalId\":206237,\"journal\":{\"name\":\"2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)\",\"volume\":\"32 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IPFA.2016.7564321\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IPFA.2016.7564321","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Logics of Failure Analysis: 20 Years of rules of the Rue Morgue
The logical rules of Failure Analysis, and their frequent violations are discussed. The joke of comparing Failure Analysis with a crime story, that prompted the seminal paper on 1995 and its follower in 2006, is here more directly explained in terms of good and bad practice.