通过机械仿真和可靠性验证开发健壮的电源封装

Xueren Zhang, K. Goh, Yiyi Ma, W. Wong
{"title":"通过机械仿真和可靠性验证开发健壮的电源封装","authors":"Xueren Zhang, K. Goh, Yiyi Ma, W. Wong","doi":"10.1109/IEMT.2012.6521771","DOIUrl":null,"url":null,"abstract":"Thermo-mechanical reliability is one of the major concerns for electronic packages, especially for power packages operating in extremely harsh environment. As the trends towards high density and function integration, advanced power device becomes more sensitive to environmental stress. Comprehensive study is needed from design, process to test towards robust power package with high reliability. In this paper, we will demonstrate the successful application of simulation in the development of a series of robust leaded power packages. Firstly, finite element analysis(FEA) has been carried out to understand die stress behavior inside the package during assembly and reliability tests, i.e. from die attach, post mold cure, reflow to thermal cycling etc. Then DOE matrix is run to obtain the critical responses to different factors, which leads to guidelines on package design and material selection. A series of robust power packages have been developed with optimized package geometry and bill of materials.","PeriodicalId":315408,"journal":{"name":"2012 35th IEEE/CPMT International Electronics Manufacturing Technology Conference (IEMT)","volume":"54 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Robust power package development with mechanical simulation and reliability validation\",\"authors\":\"Xueren Zhang, K. Goh, Yiyi Ma, W. Wong\",\"doi\":\"10.1109/IEMT.2012.6521771\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Thermo-mechanical reliability is one of the major concerns for electronic packages, especially for power packages operating in extremely harsh environment. As the trends towards high density and function integration, advanced power device becomes more sensitive to environmental stress. Comprehensive study is needed from design, process to test towards robust power package with high reliability. In this paper, we will demonstrate the successful application of simulation in the development of a series of robust leaded power packages. Firstly, finite element analysis(FEA) has been carried out to understand die stress behavior inside the package during assembly and reliability tests, i.e. from die attach, post mold cure, reflow to thermal cycling etc. Then DOE matrix is run to obtain the critical responses to different factors, which leads to guidelines on package design and material selection. A series of robust power packages have been developed with optimized package geometry and bill of materials.\",\"PeriodicalId\":315408,\"journal\":{\"name\":\"2012 35th IEEE/CPMT International Electronics Manufacturing Technology Conference (IEMT)\",\"volume\":\"54 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 35th IEEE/CPMT International Electronics Manufacturing Technology Conference (IEMT)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEMT.2012.6521771\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 35th IEEE/CPMT International Electronics Manufacturing Technology Conference (IEMT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEMT.2012.6521771","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

热机械可靠性是电子封装的主要问题之一,特别是在极其恶劣的环境中工作的动力封装。随着大功率器件向高密度化和功能集成化发展,其对环境应力的敏感性越来越高。从设计、工艺到测试,需要对高可靠性的鲁棒电源进行全面的研究。在本文中,我们将展示仿真在一系列鲁棒铅电源封装开发中的成功应用。首先,进行了有限元分析(FEA),以了解封装内在装配和可靠性测试期间的模具应力行为,即从模具附着,模后固化,回流到热循环等。然后运行DOE矩阵,得到不同因素下的临界响应,从而为封装设计和材料选择提供指导。开发了一系列具有优化封装几何形状和材料清单的坚固电源封装。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Robust power package development with mechanical simulation and reliability validation
Thermo-mechanical reliability is one of the major concerns for electronic packages, especially for power packages operating in extremely harsh environment. As the trends towards high density and function integration, advanced power device becomes more sensitive to environmental stress. Comprehensive study is needed from design, process to test towards robust power package with high reliability. In this paper, we will demonstrate the successful application of simulation in the development of a series of robust leaded power packages. Firstly, finite element analysis(FEA) has been carried out to understand die stress behavior inside the package during assembly and reliability tests, i.e. from die attach, post mold cure, reflow to thermal cycling etc. Then DOE matrix is run to obtain the critical responses to different factors, which leads to guidelines on package design and material selection. A series of robust power packages have been developed with optimized package geometry and bill of materials.
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