Y. W. Cheong, E. Then, Cheong Huat Ng, G. S. Lee, M. Diaz, G. De Guia, Mon Leong Loke
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引用次数: 0
摘要
底部填充是倒装芯片技术中通常使用的一种材料,用于在芯片和基板之间提供机械粘合。在最近开发新型 FC-BGA 封装的过程中,面临的主要挑战之一是如何选择一种具有自毛边功能的单次点胶底部填充材料。在评估过程中,遇到了一个新的圆角缺陷。在环氧树脂后的目视检查中,该缺陷导致产量损失约 30%。但仔细观察后发现,最初看起来是裂纹,后来通过 FA 横截面结果发现是一条与模具边缘平行的深槽,距离模具边缘不远。因此,该缺陷被称为 "Fillet 凹陷"。还有一些微凹陷只有在放大 40 倍的显微镜下才能看到。仔细观察发现,这些微凹陷的顶端富含树脂。根据所进行的共性研究,确定底层填充的额外分期时间是造成圆角凹陷的主要因素。本文详细描述了这一新缺陷,并提出了分段时间对切丝质量影响的假设。
Effect of underfill staging time on fillet depression
Underfill is a material typically used in flip-chip technology to provide a mechanical bonding between the die and the substrate. During the recent development of a new FC-BGA package, one of the main challenge was the selection of a single dispense underfill with a self-filleting capability. In the course of the evaluation a new fillet defect was encountered. The defect resulted in a yield loss of approximately 30% at the post epoxy visual inspection. However, upon closer inspection, what appears initially as a crack was later found out through FA cross sectioned results to be a deep groove running parallel to the edge of the die, a short distance away from the die edge. The defect was consequently referred to as Fillet depression. There were also micro depressions that were visible only under a microscope at 40x magnification. Closer inspection showed these micro depressions have resin rich tips. From the commonality study conducted the additional staging time for the underfill was determined to be the dominant factor that cause fillet depression. This paper includes a detail description of the new defect and a hypothesis for the effect of staging time on the filleting quality.