微处理器功能验证的自动测试生成

Proceedings of IEEE 3rd Asian Test Symposium (ATS) Pub Date : 1994-11-15 DOI:10.1109/ATS.1994.367216

J. Miyake, G. Brown, M. Ueda, T. Nishiyama

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引用次数: 12

摘要

提出了一种生成微处理器功能验证测试程序的新方法。该方法将随机生成和特定序列生成相结合。利用四层层次信息生成包含许多复杂序列的高效测试程序。还讨论了测试生成中的注意事项。

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Automatic test generation for functional verification of microprocessors

A novel method to generate test programs for functional verification of microprocessors is presented. The method combines schemes of random generation and specific sequence generation. Four levels of hierarchical information are used to generate efficient test programs including many complicated sequences. Considerations in the test generation is also discussed.<>

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Proceedings of IEEE 3rd Asian Test Symposium (ATS)

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