{"title":"衬底电导率对耦合电感影响的仿真与建模","authors":"Y. Massoud, J. White","doi":"10.1109/IEDM.1995.499245","DOIUrl":null,"url":null,"abstract":"The goal of this work was to extend the FASTHENRY 3-D inductance extraction program to include the finite conductivity of a semiconductor substrate, and then use the modified program to investigate a variety of on-chip inductive effects. In addition, the limitations of a simple two-loop model for estimating coupling inductance is examined.","PeriodicalId":137564,"journal":{"name":"Proceedings of International Electron Devices Meeting","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"15","resultStr":"{\"title\":\"Simulation and modeling of the effect of substrate conductivity on coupling inductance\",\"authors\":\"Y. Massoud, J. White\",\"doi\":\"10.1109/IEDM.1995.499245\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The goal of this work was to extend the FASTHENRY 3-D inductance extraction program to include the finite conductivity of a semiconductor substrate, and then use the modified program to investigate a variety of on-chip inductive effects. In addition, the limitations of a simple two-loop model for estimating coupling inductance is examined.\",\"PeriodicalId\":137564,\"journal\":{\"name\":\"Proceedings of International Electron Devices Meeting\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1995-12-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"15\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of International Electron Devices Meeting\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEDM.1995.499245\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of International Electron Devices Meeting","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEDM.1995.499245","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Simulation and modeling of the effect of substrate conductivity on coupling inductance
The goal of this work was to extend the FASTHENRY 3-D inductance extraction program to include the finite conductivity of a semiconductor substrate, and then use the modified program to investigate a variety of on-chip inductive effects. In addition, the limitations of a simple two-loop model for estimating coupling inductance is examined.