倒装芯片碰撞用无铅合金

E. Jung, R. Aschenbrenner, C. Kallmayer, P. Coskina, H. Reichl
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引用次数: 4

摘要

除了区域阵列封装的生态和电气方面,还需要开发具有与Pb/Sn焊料相似的工艺特性和使用成本的新型焊料,但这些焊料是无铅的,并且具有改进的机械性能和微观结构稳定性。随着工作温度的升高,标准合金无法承受由热循环引起的疲劳增加。目前的铅锡焊料缺乏抗剪切强度、抗蠕变性能和抗热机械疲劳性能。在汽车和其他高可靠性产品和高温组件中,表现出这些性能增强的焊料至关重要。在电子封装中,通常的做法是用不同熔点的不同焊料焊接封装的各个级别,以便每个后续级别或步骤的焊接不会重新熔化先前焊接的接头。根据特定的应用,本文提出了最适合区域阵列封装(倒装芯片,CSP, BGA)的焊料合金。给出了初步的可靠性结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Lead free alloys for flip chip bumping
In addition to the ecological and electrical aspects of area array packages, there is a need to develop new solders with similar process characteristics and usage cost to Pb/Sn solders, but which are lead free and have improved mechanical properties and microstructural stability. As operating temperatures increase, standard alloys are unable to withstand the increased fatigue caused by the thermal cycling. Current lead-tin solders lack shear strength, creep resistance and thermal mechanical fatigue resistance. A solder which exhibits enhancements of these properties is crucial in automotive and other high-reliability products and high-temperature assemblies. In electronic packaging, it is common practice to solder the various levels of the package with different solders of different melting points so that the soldering of each successive level or step does not remelt the previously soldered joints. Depending on the particular applications, the most suitable solder alloys for area array packages (flip chip, CSP, BGA) are presented in this paper. Initial reliability results are also given.
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