{"title":"IDDQ负电流故障分析","authors":"Ismail Hashim","doi":"10.1109/IPFA.2016.7564274","DOIUrl":null,"url":null,"abstract":"This paper describes analysis method on the negative current IDDQ failure mode. By using Visual C++ programmable script to control the steps of IDDQ measurement, circuit debugging is possible. This method helps on the findings of threshold voltage shifted on Disable pin which crucial for IDDQ test mode of that particular device.","PeriodicalId":206237,"journal":{"name":"2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-07-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Failure analysis on IDDQ negative current issue\",\"authors\":\"Ismail Hashim\",\"doi\":\"10.1109/IPFA.2016.7564274\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes analysis method on the negative current IDDQ failure mode. By using Visual C++ programmable script to control the steps of IDDQ measurement, circuit debugging is possible. This method helps on the findings of threshold voltage shifted on Disable pin which crucial for IDDQ test mode of that particular device.\",\"PeriodicalId\":206237,\"journal\":{\"name\":\"2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-07-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IPFA.2016.7564274\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IPFA.2016.7564274","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
This paper describes analysis method on the negative current IDDQ failure mode. By using Visual C++ programmable script to control the steps of IDDQ measurement, circuit debugging is possible. This method helps on the findings of threshold voltage shifted on Disable pin which crucial for IDDQ test mode of that particular device.