A novel WLCSP technology with high reliability, low cost and ease of fabrication

Wafer level chip scale packaging (WLCSP) has some advantages, such as real die size packaging, high electrical performance and low manufacturing cost. However, because the mechanical reliability of a large die can not be guaranteed due to the CTE (coefficient of thermal expansion) mismatch between silicon and organic PCB (printed circuit board), WLCSP technology is still not fully accepted. We have developed a new SJP-WLCSP (solder joint protection-WLCSP) structure with a delamination layer interposed between the top layer of the chip and the bottom insulating layer of the metal redistribution traces. The stress on the solder joints can be released by the cracks forming in the delamination layer, which protects the solder joints from cracking. Since the cracking of the delamination layer is irrelevant to the electrical circuits of the packaging, the packaged IC (integrated circuits) device remains functional. One of the possibilities for processing the SJP-WLCSP was implemented and validated successfully in the SiLK-wafer samples. The board level packaging samples, using the daisy chain resistance measurement passed 1000 cycles of the temperature cycling testing.