通过涂覆在薄片上的粘接膜,在芯片基片上制备均匀的抗蚀膜

Tomoya Onuki, Shigenori Saito, M. Sasaki
{"title":"通过涂覆在薄片上的粘接膜,在芯片基片上制备均匀的抗蚀膜","authors":"Tomoya Onuki, Shigenori Saito, M. Sasaki","doi":"10.1109/LTB-3D53950.2021.9598390","DOIUrl":null,"url":null,"abstract":"A new method of bonding the solid photoresist film is proposed for improving the thickness uniformity on the chip substrate. The water-soluble polymer supports the resist film and is dissolved before patterning. The chip area can be used up to the edge. The resist thickness demonstrated is 1.73 μm +/−1.2% in maximum deviation.","PeriodicalId":198318,"journal":{"name":"2021 7th International Workshop on Low Temperature Bonding for 3D Integration (LTB-3D)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2021-10-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Uniform resist film on chip substrate prepared by bonding film coated on sheet\",\"authors\":\"Tomoya Onuki, Shigenori Saito, M. Sasaki\",\"doi\":\"10.1109/LTB-3D53950.2021.9598390\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A new method of bonding the solid photoresist film is proposed for improving the thickness uniformity on the chip substrate. The water-soluble polymer supports the resist film and is dissolved before patterning. The chip area can be used up to the edge. The resist thickness demonstrated is 1.73 μm +/−1.2% in maximum deviation.\",\"PeriodicalId\":198318,\"journal\":{\"name\":\"2021 7th International Workshop on Low Temperature Bonding for 3D Integration (LTB-3D)\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-10-05\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 7th International Workshop on Low Temperature Bonding for 3D Integration (LTB-3D)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/LTB-3D53950.2021.9598390\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 7th International Workshop on Low Temperature Bonding for 3D Integration (LTB-3D)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/LTB-3D53950.2021.9598390","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

提出了一种新型的固体光刻胶粘接方法,以改善芯片衬底的厚度均匀性。水溶性聚合物支撑抗蚀剂薄膜,并在图案化之前溶解。芯片区域可以使用到边缘。最大偏差为1.73 μm +/−1.2%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Uniform resist film on chip substrate prepared by bonding film coated on sheet
A new method of bonding the solid photoresist film is proposed for improving the thickness uniformity on the chip substrate. The water-soluble polymer supports the resist film and is dissolved before patterning. The chip area can be used up to the edge. The resist thickness demonstrated is 1.73 μm +/−1.2% in maximum deviation.
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