{"title":"封装与互连的建模与仿真","authors":"Jerry L. Prince","doi":"10.1109/BIPOL.1994.587855","DOIUrl":null,"url":null,"abstract":"This paper discusses electrical design of off chip and on-chip interconnects. Modeling and Simulation CAD tools used for this design are identified and described. The focus of the paper is on off-chip interconnects, which are loosely referred to as packaging structures. These may be single-chip package interconnects, or connections between chips in a multiple-chip system, and include chip electrical connections (bondwires, C4, etc.) and package or connector pins/bumps. Phenomena which are critical to error-free product performance are discussed, and alternative methods of modeling and simulating these phenomena are presented. Similarities and differences of on-chip and off-chip interconnect characteristics are noted when appropriate.","PeriodicalId":373721,"journal":{"name":"Proceedings of IEEE Bipolar/BiCMOS Circuits and Technology Meeting","volume":"14 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Modeling and simulation of package and interconnects\",\"authors\":\"Jerry L. Prince\",\"doi\":\"10.1109/BIPOL.1994.587855\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper discusses electrical design of off chip and on-chip interconnects. Modeling and Simulation CAD tools used for this design are identified and described. The focus of the paper is on off-chip interconnects, which are loosely referred to as packaging structures. These may be single-chip package interconnects, or connections between chips in a multiple-chip system, and include chip electrical connections (bondwires, C4, etc.) and package or connector pins/bumps. Phenomena which are critical to error-free product performance are discussed, and alternative methods of modeling and simulating these phenomena are presented. Similarities and differences of on-chip and off-chip interconnect characteristics are noted when appropriate.\",\"PeriodicalId\":373721,\"journal\":{\"name\":\"Proceedings of IEEE Bipolar/BiCMOS Circuits and Technology Meeting\",\"volume\":\"14 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-10-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of IEEE Bipolar/BiCMOS Circuits and Technology Meeting\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/BIPOL.1994.587855\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of IEEE Bipolar/BiCMOS Circuits and Technology Meeting","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/BIPOL.1994.587855","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Modeling and simulation of package and interconnects
This paper discusses electrical design of off chip and on-chip interconnects. Modeling and Simulation CAD tools used for this design are identified and described. The focus of the paper is on off-chip interconnects, which are loosely referred to as packaging structures. These may be single-chip package interconnects, or connections between chips in a multiple-chip system, and include chip electrical connections (bondwires, C4, etc.) and package or connector pins/bumps. Phenomena which are critical to error-free product performance are discussed, and alternative methods of modeling and simulating these phenomena are presented. Similarities and differences of on-chip and off-chip interconnect characteristics are noted when appropriate.