基于网格的可重构封装的TAM线路路由和测试调度协同优化

Jui-Hung Hung, Shih-Hsu Huang, Chun-Hua Cheng, Hsu-Yu Kao, W. Cheng
{"title":"基于网格的可重构封装的TAM线路路由和测试调度协同优化","authors":"Jui-Hung Hung, Shih-Hsu Huang, Chun-Hua Cheng, Hsu-Yu Kao, W. Cheng","doi":"10.1109/VTS48691.2020.9107604","DOIUrl":null,"url":null,"abstract":"A reconfigurable wrapper provides the flexibility for a core test to utilize different bandwidths of test access mechanism (TAM) at different test time points. By using reconfigurable wrappers, the lower bound of total test application time can be achieved. However, since reconfigurable wrappers attempt to utilize TAM bandwidth as fully as possible, they often consume a lot of routing resources. In advanced technology nodes, routability has become a critical and difficult issue. In this paper, based on reconfigurable wrappers, we present the first work that studies the correlation between grid-based TAM wire routing and test scheduling. Our objective is to derive a feasible grid-based TAM wire routing solution with the minimum total test application time. Compared with previous works, the main advantage of our approach is that it can resolve the grid-based TAM wire routing congestion problem during test scheduling. Benchmark data show that our approach can effectively and efficiently minimize the total test application time under grid-based routing congestion constraints.","PeriodicalId":326132,"journal":{"name":"2020 IEEE 38th VLSI Test Symposium (VTS)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2020-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Co-Optimization of Grid-Based TAM Wire Routing and Test Scheduling with Reconfigurable Wrappers\",\"authors\":\"Jui-Hung Hung, Shih-Hsu Huang, Chun-Hua Cheng, Hsu-Yu Kao, W. Cheng\",\"doi\":\"10.1109/VTS48691.2020.9107604\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A reconfigurable wrapper provides the flexibility for a core test to utilize different bandwidths of test access mechanism (TAM) at different test time points. By using reconfigurable wrappers, the lower bound of total test application time can be achieved. However, since reconfigurable wrappers attempt to utilize TAM bandwidth as fully as possible, they often consume a lot of routing resources. In advanced technology nodes, routability has become a critical and difficult issue. In this paper, based on reconfigurable wrappers, we present the first work that studies the correlation between grid-based TAM wire routing and test scheduling. Our objective is to derive a feasible grid-based TAM wire routing solution with the minimum total test application time. Compared with previous works, the main advantage of our approach is that it can resolve the grid-based TAM wire routing congestion problem during test scheduling. Benchmark data show that our approach can effectively and efficiently minimize the total test application time under grid-based routing congestion constraints.\",\"PeriodicalId\":326132,\"journal\":{\"name\":\"2020 IEEE 38th VLSI Test Symposium (VTS)\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-04-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 IEEE 38th VLSI Test Symposium (VTS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VTS48691.2020.9107604\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE 38th VLSI Test Symposium (VTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTS48691.2020.9107604","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

可重新配置的包装器为核心测试提供了灵活性,可以在不同的测试时间点利用测试访问机制(TAM)的不同带宽。通过使用可重构包装器,可以达到测试应用总时间的下界。然而,由于可重构包装器试图尽可能充分地利用TAM带宽,因此它们通常会消耗大量路由资源。在先进的技术节点中,路由可达性已经成为一个关键而困难的问题。本文在可重构封装器的基础上,首次研究了基于网格的TAM布线与测试调度之间的关系。我们的目标是用最少的总测试应用时间推导出一个可行的基于网格的TAM布线解决方案。与以往的工作相比,该方法的主要优点是解决了测试调度过程中基于网格的TAM布线拥塞问题。基准测试数据表明,在基于网格的路由拥塞约束下,我们的方法可以有效地减少总测试应用时间。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Co-Optimization of Grid-Based TAM Wire Routing and Test Scheduling with Reconfigurable Wrappers
A reconfigurable wrapper provides the flexibility for a core test to utilize different bandwidths of test access mechanism (TAM) at different test time points. By using reconfigurable wrappers, the lower bound of total test application time can be achieved. However, since reconfigurable wrappers attempt to utilize TAM bandwidth as fully as possible, they often consume a lot of routing resources. In advanced technology nodes, routability has become a critical and difficult issue. In this paper, based on reconfigurable wrappers, we present the first work that studies the correlation between grid-based TAM wire routing and test scheduling. Our objective is to derive a feasible grid-based TAM wire routing solution with the minimum total test application time. Compared with previous works, the main advantage of our approach is that it can resolve the grid-based TAM wire routing congestion problem during test scheduling. Benchmark data show that our approach can effectively and efficiently minimize the total test application time under grid-based routing congestion constraints.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信