{"title":"高带宽存储器(HBM)供电网络设计与建模","authors":"Wenjun Shi, Yaping Zhou, Sunil R. Sudhakaran","doi":"10.1109/EPEPS.2016.7835405","DOIUrl":null,"url":null,"abstract":"A modeling method to consider simulation switching noise of HBM and its impact on HBM timing is described. This method combines partial element equivalent circuit model for power delivery network and S-parameters based HBM channel model together in HBM studies.","PeriodicalId":241629,"journal":{"name":"2016 IEEE 25th Conference on Electrical Performance Of Electronic Packaging And Systems (EPEPS)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"Power delivery network design and modeling for High Bandwidth Memory (HBM)\",\"authors\":\"Wenjun Shi, Yaping Zhou, Sunil R. Sudhakaran\",\"doi\":\"10.1109/EPEPS.2016.7835405\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A modeling method to consider simulation switching noise of HBM and its impact on HBM timing is described. This method combines partial element equivalent circuit model for power delivery network and S-parameters based HBM channel model together in HBM studies.\",\"PeriodicalId\":241629,\"journal\":{\"name\":\"2016 IEEE 25th Conference on Electrical Performance Of Electronic Packaging And Systems (EPEPS)\",\"volume\":\"4 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE 25th Conference on Electrical Performance Of Electronic Packaging And Systems (EPEPS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPEPS.2016.7835405\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE 25th Conference on Electrical Performance Of Electronic Packaging And Systems (EPEPS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEPS.2016.7835405","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Power delivery network design and modeling for High Bandwidth Memory (HBM)
A modeling method to consider simulation switching noise of HBM and its impact on HBM timing is described. This method combines partial element equivalent circuit model for power delivery network and S-parameters based HBM channel model together in HBM studies.